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A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system
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Authors
Nguyen, Van
;
De Beenhouwer, Jan
;
Sanctorum, Jonathan
;
Van Wassenbergh, Sam
;
Aerts, Peter
;
Dirckx, Joris J. J.
;
Sijbers, Jan
Conference
9th Conference on Industrial Computed Tomography - iCT19
Title
A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system
Publication type
Proceedings paper
Embargo date
9999-12-31
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