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CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images

dc.contributor.authorPresenti, Alice
dc.contributor.authorSijbers, Jan
dc.contributor.authorden Dekker, Arnold J.
dc.contributor.authorDe Beenhouwer, Jan
dc.date.accessioned2021-10-27T16:21:58Z
dc.date.available2021-10-27T16:21:58Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33825
dc.sourceIIOimport
dc.titleCAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images
dc.typeProceedings paper
dc.contributor.imecauthorPresenti, Alice
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conference9th International Conference on Industrial Computed Tomography - iCT
dc.source.conferencedate13/02/2019
dc.source.conferencelocationPadova Italy
dc.identifier.urlhttps://visielab.uantwerpen.be/sites/default/files/abstract_ict2019_ap_29062018.pdf
imec.availabilityPublished - open access


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