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Deep learning based missing wedge artefact removal for electron tomography

dc.contributor.authorRimpeläinen, Juho
dc.contributor.authorBazrafkan, S.
dc.contributor.authorSijbers, Jan
dc.contributor.authorDe Beenhouwer, Jan
dc.date.accessioned2021-10-27T17:06:50Z
dc.date.available2021-10-27T17:06:50Z
dc.date.issued2019-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33894
dc.sourceIIOimport
dc.titleDeep learning based missing wedge artefact removal for electron tomography
dc.typeMeeting abstract
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.source.peerreviewyes
dc.source.beginpage660
dc.source.endpage661
dc.source.conferenceMicroscopy Conference
dc.source.conferencedate1/09/2019
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - imec


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