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Towards automated security design flaw detection

dc.contributor.authorSion, Laurens
dc.contributor.authorTuma, Katja
dc.contributor.authorScandariato, Riccardo
dc.contributor.authorYskout, Koen
dc.contributor.authorJoosen, Wouter
dc.date.accessioned2021-10-27T18:28:18Z
dc.date.available2021-10-27T18:28:18Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34018
dc.sourceIIOimport
dc.titleTowards automated security design flaw detection
dc.typeProceedings paper
dc.contributor.imecauthorJoosen, Wouter
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference2019 34th IEEE/ACM International Conference on Automated Software Engineering Workshop (ASEW)
dc.source.conferencedate11/11/2019
dc.source.conferencelocationSan Diego,CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8967432
imec.availabilityPublished - open access


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