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Compensating defects in epitaxial Ge and GexSn1-x

dc.contributor.authorSlotte, Jonatan
dc.contributor.authorKhanam, Afrina
dc.contributor.authorVohra, Anurag
dc.contributor.authorMakkonen, Ilja
dc.contributor.authorLoo, Roger
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorPorret, Clément
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-27T18:36:34Z
dc.date.available2021-10-27T18:36:34Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34030
dc.sourceIIOimport
dc.titleCompensating defects in epitaxial Ge and GexSn1-x
dc.typeMeeting abstract
dc.contributor.imecauthorVohra, Anurag
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorPorret, Clément
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecVohra, Anurag::0000-0002-2831-0719
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecPorret, Clément::0000-0002-4561-348X
dc.source.peerreviewno
dc.source.conferenceE-MRS Fall Meeting Warsaw 2019
dc.source.conferencedate16/09/2019
dc.source.conferencelocationWarsaw Poland
dc.identifier.urlhttps://www.european-mrs.com/integration-advanced-materials-silicon-classical-quantum-applications-emrs
imec.availabilityPublished - imec


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