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WS2 MOSFETs: significant performance improvement with Mg contacts

dc.contributor.authorSutar, Surajit
dc.contributor.authorMongillo, Massimo
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorCaymax, Matty
dc.contributor.authorLin, Dennis
dc.contributor.authorRadu, Iuliana
dc.date.accessioned2021-10-27T19:16:07Z
dc.date.available2021-10-27T19:16:07Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34089
dc.sourceIIOimport
dc.titleWS2 MOSFETs: significant performance improvement with Mg contacts
dc.typeProceedings paper
dc.contributor.imecauthorSutar, Surajit
dc.contributor.imecauthorMongillo, Massimo
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecMongillo, Massimo::0000-0002-6475-6320
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.source.peerreviewyes
dc.source.beginpage4.28
dc.source.conferenceIEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019)
dc.source.conferencedate3/06/2019
dc.source.conferencelocationBrussels Belgium
dc.identifier.urlhttps://iitc-conference.org/2019-iitc-mam-program/
imec.availabilityPublished - imec


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