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Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs

dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorEl-Sayed, Al-Moatasem
dc.contributor.authorMakarov, Alexander
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorJech, Markus
dc.contributor.authorCapogreco, Elena
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorGrill, Alexander
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorEneman, Geert
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-27T20:05:02Z
dc.date.available2021-10-27T20:05:02Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34160
dc.sourceIIOimport
dc.titleUnderstanding and physical modeling superior hot-carrier reliability of Ge pNWFETs
dc.typeProceedings paper
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorCapogreco, Elena
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage21.3.1
dc.source.endpage21.3.4
dc.source.conferenceIEEE Internaitonal Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8993644
imec.availabilityPublished - imec


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