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Automated regression testing of a GCC toolchain used on embedded CPU programs

dc.contributor.authorVankeirsbilck, Jens
dc.contributor.authorVan Waes, Jonas
dc.contributor.authorHallez, Hans
dc.contributor.authorBoydens, Jeroen
dc.date.accessioned2021-10-27T21:58:33Z
dc.date.available2021-10-27T21:58:33Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34321
dc.sourceIIOimport
dc.titleAutomated regression testing of a GCC toolchain used on embedded CPU programs
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceInternational Scientific Conference electronics - ET
dc.source.conferencedate12/09/2019
dc.source.conferencelocationSozopol Bulgaria
dc.identifier.url
imec.availabilityPublished - open access


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