| dc.contributor.author | Verbauwhede, Ingrid | |
| dc.contributor.author | Chuang, Kent | |
| dc.date.accessioned | 2021-10-27T22:22:01Z | |
| dc.date.available | 2021-10-27T22:22:01Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34350 | |
| dc.source | IIOimport | |
| dc.title | Security and reliability: friend or foe? | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | Chuang, Kent | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | yes | |
| dc.source.beginpage | 290 | |
| dc.source.endpage | 293 | |
| dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
| dc.source.conferencedate | 7/12/2019 | |
| dc.source.conferencelocation | San Francisco, CA USA | |
| dc.identifier.url | https://ieee-iedm.org/wp-content/uploads/2019/10/session-13.pdf | |
| imec.availability | Published - open access | |
| imec.internalnotes | Session 13 - Reliability of Systems and Devices - Focus Session: Reliability and Security in Circuits and Systems aff ok | |
