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Impact of the substrate quality on the low frequency noise of silicon diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorBosman, Gijs
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T12:47:18Z
dc.date.available2021-09-29T12:47:18Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/343
dc.sourceIIOimport
dc.titleImpact of the substrate quality on the low frequency noise of silicon diodes
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference6th Van der Ziel Symposium on Quantum 1/f Noise and Other Low Frequency Fluctuations in Electronic Devices
dc.source.conferencedate27/05/1994
dc.source.conferencelocationSt. Louis, MO USA
imec.availabilityPublished - imec
imec.internalnotesto be publ. AIP Conference Proceedings 371(1996)


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