Show simple item record

Pinhole defect characterization and modeling for STT-MRAM testing

dc.contributor.authorWu, Lizhou
dc.contributor.authorRao, Siddharth
dc.contributor.authorCardoso Medeiros, Guilherme
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCouet, Sebastien
dc.contributor.authorHamdioui, Said
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-27T23:42:21Z
dc.date.available2021-10-27T23:42:21Z
dc.date.issued2019-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34457
dc.sourceIIOimport
dc.titlePinhole defect characterization and modeling for STT-MRAM testing
dc.typeProceedings paper
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conferenceIEEE European Test Symposium (ETS) 2019
dc.source.conferencedate27/05/2019
dc.source.conferencelocationBaden-Baden Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record