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Physical insights on steep slope FEFETs including nucleation-propagation and charge trapping

dc.contributor.authorXiang, Yang
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorAlam, Md Nur Kutubul
dc.contributor.authorThesberg, Mischa
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorTruijen, Brecht
dc.contributor.authorVerhulst, Anne
dc.contributor.authorParvais, Bertrand
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-27T23:49:17Z
dc.date.available2021-10-27T23:49:17Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34466
dc.sourceIIOimport
dc.titlePhysical insights on steep slope FEFETs including nucleation-propagation and charge trapping
dc.typeProceedings paper
dc.contributor.imecauthorXiang, Yang
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorAlam, Md Nur Kutubul
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorTruijen, Brecht
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecXiang, Yang::0000-0003-0091-6935
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecTruijen, Brecht::0000-0002-2288-1414
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage510
dc.source.endpage513
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedate7/12/2019
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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