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Characterization of superhydrophobic breakdown on nanostructured silicon surfaces

dc.contributor.authorXu, XiuMei
dc.contributor.authorVrancken, Nandi
dc.date.accessioned2021-10-27T23:53:32Z
dc.date.available2021-10-27T23:53:32Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34472
dc.sourceIIOimport
dc.titleCharacterization of superhydrophobic breakdown on nanostructured silicon surfaces
dc.typeMeeting abstract
dc.contributor.imecauthorXu, XiuMei
dc.contributor.imecauthorVrancken, Nandi
dc.contributor.orcidimecXu, XiuMei::0000-0002-3356-8693
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceINTERM - International Congress on Microscopy and Spectroscopy
dc.source.conferencedate12/05/2019
dc.source.conferencelocationOludeniz turkey
imec.availabilityPublished - open access


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