Correlation between the LF noise/RTS parameters of Si MOSFETs
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-09-29T12:47:20Z | |
dc.date.available | 2021-09-29T12:47:20Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/344 | |
dc.source | IIOimport | |
dc.title | Correlation between the LF noise/RTS parameters of Si MOSFETs | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | 1st ELEN Workshop on Noise in Electronic Systems | |
dc.source.conferencedate | 18/10/1994 | |
dc.source.conferencelocation | Montpellier France | |
imec.availability | Published - open access |