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Si-cap-free low-DIT SiGe gate stack for high-performance pFETs
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Authors
Arimura, Hiroaki
;
Wostyn, Kurt
;
Ragnarsson, Lars-Ake
;
Conard, Thierry
;
Vaisman Chasin, Adrian
;
Franco, Jacopo
;
Mitard, Jerome
;
Horiguchi, Naoto
Conference
ECS 2020 Fall Meeting Symposium G03: SiGe, Ge & Related Compounds: Materials, Processing and Devices
Title
Si-cap-free low-DIT SiGe gate stack for high-performance pFETs
Publication type
Meeting abstract
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