Show simple item record

Reliability of ultra-thin oxides for the giga-bit generations

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorNigam, Tanya
dc.contributor.authorKaczer, Ben
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-06T11:14:19Z
dc.date.available2021-10-06T11:14:19Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3476
dc.sourceIIOimport
dc.titleReliability of ultra-thin oxides for the giga-bit generations
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage72
dc.source.endpage80
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference
dc.source.conferencedate13/09/1999
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record