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Nanopotentiometry: data interpretation and quantification

dc.contributor.authorHaegeman, Bart
dc.contributor.authorTrenkler, Thomas
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorDe Wolf, Peter
dc.contributor.authorHellemans, L.
dc.date.accessioned2021-10-06T11:15:27Z
dc.date.available2021-10-06T11:15:27Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3482
dc.sourceIIOimport
dc.titleNanopotentiometry: data interpretation and quantification
dc.typeProceedings paper
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpage192
dc.source.endpage195
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
imec.availabilityPublished - imec


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