Degradation of MOSFETs on SIMOX by irradiation

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Authors

Hakata, T.; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Miyahara, K.; Kawamura, K.; Ogita, Y.; Takami, Y.

Issue

2

Journal

Journal of Radioanalytical and Nuclear Chemistry

Volume

239

Title

Degradation of MOSFETs on SIMOX by irradiation

Publication type

Journal article

Embargo date

9999-12-31

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