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Degradation of MOSFETs on SIMOX by irradiation

dc.contributor.authorHakata, T.
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMiyahara, K.
dc.contributor.authorKawamura, K.
dc.contributor.authorOgita, Y.
dc.contributor.authorTakami, Y.
dc.date.accessioned2021-10-06T11:16:02Z
dc.date.available2021-10-06T11:16:02Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3485
dc.sourceIIOimport
dc.titleDegradation of MOSFETs on SIMOX by irradiation
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage357
dc.source.endpage360
dc.source.journalJournal of Radioanalytical and Nuclear Chemistry
dc.source.issue2
dc.source.volume239
imec.availabilityPublished - open access


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