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Technology impact on the low frequency noise of Si and Si/SiGe superlattice input-output FinFETs

dc.contributor.authorClaeys, Cor
dc.contributor.authorHellings, Geert
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorBertrand, Kaoutar
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorDekkers, Harold
dc.contributor.authorSchram, Tom
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorSimoen, Eddy
dc.contributor.authorBoudin, Dimitri
dc.contributor.authorCetu, Bogdan
dc.date.accessioned2021-10-28T20:45:57Z
dc.date.available2021-10-28T20:45:57Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34912
dc.sourceIIOimport
dc.titleTechnology impact on the low frequency noise of Si and Si/SiGe superlattice input-output FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorBertrand, Kaoutar
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.conference15th International Conference on Solid-State and Integrated Circuit Technology - ICSICT 2020
dc.source.conferencedate3/11/2020
dc.source.conferencelocationKunming China
imec.availabilityPublished - imec


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