Show simple item record

Discussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities

dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHellings, Geert
dc.contributor.authorLinten, Dimitri
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-28T20:53:00Z
dc.date.available2021-10-28T20:53:00Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34942
dc.sourceIIOimport
dc.titleDiscussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage45
dc.source.endpage51
dc.source.conference237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19
dc.source.conferencedate10/05/2020
dc.source.conferencelocationBristol UK
dc.identifier.urlhttps://doi.org/10.1149/09705.0045ecst
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record