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XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

dc.contributor.authorDetriche, S.
dc.contributor.authorVivegnis, Sabastien
dc.contributor.authorVanhumbeeck, J.-F.
dc.contributor.authorFelten, A.
dc.contributor.authorLouette, P.
dc.contributor.authorRenner, Frank
dc.contributor.authorDelhalle, J.
dc.contributor.authorMekhalif, Z.
dc.date.accessioned2021-10-28T21:18:34Z
dc.date.available2021-10-28T21:18:34Z
dc.date.issued2020
dc.identifier.issn0368-2048
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35046
dc.sourceIIOimport
dc.titleXPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time
dc.typeJournal article
dc.contributor.imecauthorRenner, Frank
dc.date.embargo9999-12-31
dc.identifier.doi10.1016/j.elspec.2020.146970
dc.source.peerreviewyes
dc.source.beginpage146970
dc.source.journalJournal of Electron Spectroscopy and Related Phenomena
dc.source.volume243
imec.availabilityPublished - open access


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