XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

Detriche, S.; Vivegnis, Sabastien; Vanhumbeeck, J.-F.; Felten, A.; Louette, P.; Renner, Frank; Delhalle, J.; Mekhalif, Z.

doi:10.1016/j.elspec.2020.146970

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XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

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2020

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https://doi.org/10.1016/j.elspec.2020.146970

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Journal of Electron Spectroscopy and Related Phenomena

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Acq. date: 2026-04-06

2007 since deposited on 2021-10-28

Acq. date: 2026-04-06

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

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