Publication:

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

 
dc.contributor.authorDetriche, S.
dc.contributor.authorVivegnis, Sabastien
dc.contributor.authorVanhumbeeck, J.-F.
dc.contributor.authorFelten, A.
dc.contributor.authorLouette, P.
dc.contributor.authorRenner, Frank
dc.contributor.authorDelhalle, J.
dc.contributor.authorMekhalif, Z.
dc.contributor.imecauthorRenner, Frank
dc.date.accessioned2021-10-28T21:18:34Z
dc.date.available2021-10-28T21:18:34Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.doi10.1016/j.elspec.2020.146970
dc.identifier.issn0368-2048
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35046
dc.source.beginpage146970
dc.source.journalJournal of Electron Spectroscopy and Related Phenomena
dc.source.volume243
dc.title

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

dc.typeJournal article
dspace.entity.typePublication
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