dc.contributor.author | Gallagher, Emily | |
dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Kim, Ryan Ryoung han | |
dc.contributor.author | Leray, Philippe | |
dc.contributor.author | Philipsen, Vicky | |
dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Rincon Delgadillo, Paulina | |
dc.contributor.author | Ronse, Kurt | |
dc.contributor.author | Timmermans, Marina | |
dc.contributor.author | De Simone, Danilo | |
dc.date.accessioned | 2021-10-28T21:48:30Z | |
dc.date.available | 2021-10-28T21:48:30Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35146 | |
dc.source | IIOimport | |
dc.title | EUV lithography and the materials that propel it forward | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Gallagher, Emily | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Kim, Ryan Ryoung han | |
dc.contributor.imecauthor | Leray, Philippe | |
dc.contributor.imecauthor | Philipsen, Vicky | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.imecauthor | Rincon Delgadillo, Paulina | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.imecauthor | Timmermans, Marina | |
dc.contributor.imecauthor | De Simone, Danilo | |
dc.contributor.orcidimec | Gallagher, Emily::0000-0002-2927-8298 | |
dc.contributor.orcidimec | Philipsen, Vicky::0000-0002-2959-432X | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.contributor.orcidimec | Timmermans, Marina::0000-0001-9805-8259 | |
dc.contributor.orcidimec | De Simone, Danilo::0000-0003-3927-5207 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | 2020 EUVL Workshop | |
dc.source.conferencedate | 7/06/2020 | |
dc.source.conferencelocation | Online Online | |
dc.identifier.url | https://www.euvlitho.com/2020/2020%20EUVL%20Workshop%20Keynote%20Gallagher.pdf | |
imec.availability | Published - open access | |