dc.contributor.author | Houssa, Michel | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | de Bokx, P. | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-06T11:22:31Z | |
dc.date.available | 2021-10-06T11:22:31Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3518 | |
dc.source | IIOimport | |
dc.title | X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides | |
dc.type | Journal article | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 43 | |
dc.source.endpage | 46 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 1_4 | |
dc.source.volume | 48 | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of the 11th Biennial Conf. on Insulating Films on Semiconductors - INFOS '99. 16-19 June, 1999. Kloster Banz, Germany | |