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X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides

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2011 since deposited on 2021-10-06
2last month
1last week
Acq. date: 2026-08-24

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2011 since deposited on 2021-10-06
2last month
1last week
Acq. date: 2026-08-24

Citations