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Articles
X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides
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X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides
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Date
1999
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
De Gendt, Stefan
;
de Bokx, P.
;
Mertens, Paul
;
Heyns, Marc
Journal
Microelectronic Engineering
Abstract
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2007
since deposited on 2021-10-06
Acq. date: 2025-12-15
Citations
Metrics
Views
2007
since deposited on 2021-10-06
Acq. date: 2025-12-15
Citations