dc.contributor.author | Higashi, Yusuke | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | McMitchell, Sean | |
dc.contributor.author | Banerjee, Kaustuv | |
dc.contributor.author | Di Piazza, Luca | |
dc.contributor.author | Suzuki, Masamichi | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-28T22:34:25Z | |
dc.date.available | 2021-10-28T22:34:25Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35275 | |
dc.source | IIOimport | |
dc.title | Investigation of imprint in FE-HfO2 and its recovery | |
dc.type | Journal article | |
dc.contributor.imecauthor | Higashi, Yusuke | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | McMitchell, Sean | |
dc.contributor.imecauthor | Banerjee, Kaustuv | |
dc.contributor.imecauthor | Di Piazza, Luca | |
dc.contributor.imecauthor | Suzuki, Masamichi | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4911 | |
dc.source.endpage | 4917 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 11 | |
dc.source.volume | 67 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/9214848 | |
imec.availability | Published - imec | |