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Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell

dc.contributor.authorIrace, A.
dc.contributor.authorSirleto, L.
dc.contributor.authorVitale, G. F.
dc.contributor.authorCutolo, A.
dc.contributor.authorZeni, L.
dc.contributor.authorHorzel, Jörg
dc.contributor.authorSzlufcik, Jozef
dc.date.accessioned2021-10-06T11:24:44Z
dc.date.available2021-10-06T11:24:44Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3529
dc.sourceIIOimport
dc.titleTransverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell
dc.typeJournal article
dc.contributor.imecauthorSzlufcik, Jozef
dc.source.peerreviewno
dc.source.beginpage2235
dc.source.endpage2242
dc.source.journalSolid-State Electronics
dc.source.issue12
dc.source.volume43
imec.availabilityPublished - imec


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