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Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell
Publication:
Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Irace, A.
;
Sirleto, L.
;
Vitale, G. F.
;
Cutolo, A.
;
Zeni, L.
;
Horzel, Jörg
;
Szlufcik, Jozef
Journal
Solid-State Electronics
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1849
since deposited on 2021-10-06
Acq. date: 2025-10-24
Citations
Metrics
Views
1849
since deposited on 2021-10-06
Acq. date: 2025-10-24
Citations