Publication:
Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell
Date
| dc.contributor.author | Irace, A. | |
| dc.contributor.author | Sirleto, L. | |
| dc.contributor.author | Vitale, G. F. | |
| dc.contributor.author | Cutolo, A. | |
| dc.contributor.author | Zeni, L. | |
| dc.contributor.author | Horzel, Jörg | |
| dc.contributor.author | Szlufcik, Jozef | |
| dc.contributor.imecauthor | Szlufcik, Jozef | |
| dc.date.accessioned | 2021-10-06T11:24:44Z | |
| dc.date.available | 2021-10-06T11:24:44Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3529 | |
| dc.source.beginpage | 2235 | |
| dc.source.endpage | 2242 | |
| dc.source.issue | 12 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 43 | |
| dc.title | Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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