Authors

Huynen, Martijn; Kapusuz, Kamil Yavuz; Sun, Xiao; Van der Plas, Geert; Beyne, Eric; De Zutter, Daniel; Vande Ginste, Dries

ISSN

0018-9480

Issue

4

Journal

IEEE Transactions on Microwave Theory and Techniques

Volume

68

Title

Entire domain basis function expansion of the differential surface admittance for efficient broadband characterization of lossy interconnects

Publication type

Journal article

Embargo date

9999-12-31