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Entire domain basis function expansion of the differential surface admittance for efficient broadband characterization of lossy interconnects

dc.contributor.authorHuynen, Martijn
dc.contributor.authorKapusuz, Kamil Yavuz
dc.contributor.authorSun, Xiao
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorBeyne, Eric
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-28T22:44:27Z
dc.date.available2021-10-28T22:44:27Z
dc.date.issued2020
dc.identifier.issn0018-9480
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35301
dc.sourceIIOimport
dc.titleEntire domain basis function expansion of the differential surface admittance for efficient broadband characterization of lossy interconnects
dc.typeJournal article
dc.contributor.imecauthorHuynen, Martijn
dc.contributor.imecauthorKapusuz, Kamil Yavuz
dc.contributor.imecauthorSun, Xiao
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecHuynen, Martijn::0000-0002-5168-9421
dc.contributor.orcidimecKapusuz, Kamil Yavuz::0000-0003-0414-9147
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1217
dc.source.endpage1233
dc.source.journalIEEE Transactions on Microwave Theory and Techniques
dc.source.issue4
dc.source.volume68
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8948365
imec.availabilityPublished - open access


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