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eSRAM Reliability: Why is it still not optimally solved?

dc.contributor.authorKraak, Daniel
dc.contributor.authorTaouil, Motta
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-28T23:29:36Z
dc.date.available2021-10-28T23:29:36Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35412
dc.sourceIIOimport
dc.titleeSRAM Reliability: Why is it still not optimally solved?
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conference15th Intnl. Conf. on Design Technology of Integrated Systems 0n Nanoscale Era (DTIS)
dc.source.conferencedate1/10/2020
dc.source.conferencelocationMarrakesh Morocco
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9081145
imec.availabilityPublished - imec


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