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Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2

dc.contributor.authorLeonhardt, Alessandra
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorNuytten, Thomas
dc.contributor.authorBanszerus, Luca
dc.contributor.authorSergeant, Stefanie
dc.contributor.authorKoladi Mootheri, Vivek
dc.contributor.authorTaniguchi, Takashi
dc.contributor.authorWatanabe, Kenji
dc.contributor.authorStampfer, Christoph
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorDe Gendt, Stefan
dc.date.accessioned2021-10-28T23:48:56Z
dc.date.available2021-10-28T23:48:56Z
dc.date.issued2020
dc.identifier.issn2196-7350
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35456
dc.sourceIIOimport
dc.titleUse of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
dc.typeJournal article
dc.contributor.imecauthorLeonhardt, Alessandra
dc.contributor.imecauthorLockhart de la Rosa, Cesar Javier
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorSergeant, Stefanie
dc.contributor.imecauthorKoladi Mootheri, Vivek
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.contributor.orcidimecSergeant, Stefanie::0000-0001-9923-0903
dc.contributor.orcidimecKoladi Mootheri, Vivek::0000-0002-1373-8405
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewyes
dc.source.beginpage2000413
dc.source.journalAdvanced Materials Interfaces
dc.source.issue18
dc.source.volume7
dc.identifier.urlhttps://doi.org/10.1002/admi.202000413
imec.availabilityPublished - imec


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