Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Publication:
Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Copy permalink
Date
2020
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Leonhardt, Alessandra
;
Lockhart de la Rosa, Cesar Javier
;
Nuytten, Thomas
;
Banszerus, Luca
;
Sergeant, Stefanie
;
Koladi Mootheri, Vivek
;
Taniguchi, Takashi
;
Watanabe, Kenji
;
Stampfer, Christoph
;
Huyghebaert, Cedric
;
De Gendt, Stefan
Journal
Advanced Materials Interfaces
Abstract
Description
Statistics
Views
2024
since deposited on 2021-10-28
1
last month
Acq. date: 2026-02-25
Citations
Statistics
Views
2024
since deposited on 2021-10-28
1
last month
Acq. date: 2026-02-25
Citations