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Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Publication:
Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2
Date
2020
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Leonhardt, Alessandra
;
Lockhart de la Rosa, Cesar Javier
;
Nuytten, Thomas
;
Banszerus, Luca
;
Sergeant, Stefanie
;
Koladi Mootheri, Vivek
;
Taniguchi, Takashi
;
Watanabe, Kenji
;
Stampfer, Christoph
;
Huyghebaert, Cedric
;
De Gendt, Stefan
Journal
Advanced Materials Interfaces
Abstract
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2017
since deposited on 2021-10-28
Acq. date: 2025-10-25
Citations
Metrics
Views
2017
since deposited on 2021-10-28
Acq. date: 2025-10-25
Citations