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Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2

Date

2020
Journal article
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dc.contributor.authorLeonhardt, Alessandra
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorNuytten, Thomas
dc.contributor.authorBanszerus, Luca
dc.contributor.authorSergeant, Stefanie
dc.contributor.authorKoladi Mootheri, Vivek
dc.contributor.authorTaniguchi, Takashi
dc.contributor.authorWatanabe, Kenji
dc.contributor.authorStampfer, Christoph
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorDe Gendt, Stefan
dc.contributor.imecauthorLeonhardt, Alessandra
dc.contributor.imecauthorLockhart de la Rosa, Cesar Javier
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorSergeant, Stefanie
dc.contributor.imecauthorKoladi Mootheri, Vivek
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.contributor.orcidimecSergeant, Stefanie::0000-0001-9923-0903
dc.contributor.orcidimecKoladi Mootheri, Vivek::0000-0002-1373-8405
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-28T23:48:56Z
dc.date.available2021-10-28T23:48:56Z
dc.date.issued2020
dc.identifier.issn2196-7350
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35456
dc.identifier.urlhttps://doi.org/10.1002/admi.202000413
dc.source.beginpage2000413
dc.source.issue18
dc.source.journalAdvanced Materials Interfaces
dc.source.volume7
dc.title

Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2

dc.typeJournal article
dspace.entity.typePublication
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