Observation of dynamic VTH of p-GaN gate HEMTs by fast sweeping characterization

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Authors

Li, Xiangdong; Bakeroot, Benoit; Wu, Zhicheng; Amirifar, Nooshin; You, Shuzhen; Posthuma, Niels; Zhao, Ming; Liang, Hu; Groeseneken, Guido; Decoutere, Stefaan

DOI

10.1109/LED.2020.2972971

ISSN

0741-3106

Issue

4

Journal

IEEE Electron Device Letters

Volume

41

Title

Observation of dynamic VTH of p-GaN gate HEMTs by fast sweeping characterization

Publication type

Journal article

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