Publication:

Observation of dynamic VTH of p-GaN gate HEMTs by fast sweeping characterization

Date

2020
Journal article
https://doi.org/10.1109/LED.2020.2972971
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Observation_of_dynamic_VTH_of_p-GaN_gate_HEMTs_by_fast_sweeping_characterization 977.57 KB

Author(s)

Li, Xiangdong  
;
Bakeroot, Benoit  
;
Wu, Zhicheng  
;
Amirifar, Nooshin  
;
You, Shuzhen  
;
Posthuma, Niels  
;
Zhao, Ming  
;
Liang, Hu  
;
Groeseneken, Guido  
;
Decoutere, Stefaan  

Journal

IEEE Electron Device Letters

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315 since deposited on 2021-10-28
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