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Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

dc.contributor.authorMakarov, Alexander
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBury, Erik
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.date.accessioned2021-10-29T00:25:50Z
dc.date.available2021-10-29T00:25:50Z
dc.date.issued2020
dc.identifier.issn2072-666X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35535
dc.sourceIIOimport
dc.titleCorrelated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach
dc.typeJournal article
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage657
dc.source.journalMicromachines
dc.source.issue7
dc.source.volume11
dc.identifier.urlhttps://doi.org/10.3390/mi11070657
imec.availabilityPublished - open access


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