Authors

Makarov, Alexander; Roussel, Philippe; Bury, Erik; Vandemaele, Michiel; Spessot, Alessio; Linten, Dimitri; Kaczer, Ben; Tyaginov, Stanislav

ISSN

2072-666X

Issue

7

Journal

Micromachines

Volume

11

Title

Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

Publication type

Journal article

Embargo date

9999-12-31