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Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

Date

2020
Journal article
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dc.contributor.authorMakarov, Alexander
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBury, Erik
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-29T00:25:50Z
dc.date.available2021-10-29T00:25:50Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.issn2072-666X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35535
dc.identifier.urlhttps://doi.org/10.3390/mi11070657
dc.source.beginpage657
dc.source.issue7
dc.source.journalMicromachines
dc.source.volume11
dc.title

Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

dc.typeJournal article
dspace.entity.typePublication
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