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Sub-40mV Sigma-VTH IGZO nFETs in 300mm Fab

dc.contributor.authorMitard, Jerome
dc.contributor.authorKljucar, Luka
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorDekkers, Harold
dc.contributor.authorvan Setten, Michiel
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorGoux, Ludovic
dc.contributor.authorMao, Ming
dc.contributor.authorPuliyalil, Harinarayanan
dc.contributor.authorTeugels, Lieve
dc.contributor.authorTsvetanova, Diana
dc.contributor.authorNag, Manoj
dc.contributor.authorSteudel, Soeren
dc.contributor.authordel Agua Borniquel, Jose Ignacio
dc.contributor.authorRamalingam, Jothilingam
dc.contributor.authorDelhougne, Romain
dc.contributor.authorWilson, Chris
dc.contributor.authorTokei, Zsolt
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-29T00:52:37Z
dc.date.available2021-10-29T00:52:37Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35590
dc.sourceIIOimport
dc.titleSub-40mV Sigma-VTH IGZO nFETs in 300mm Fab
dc.typeProceedings paper
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorKljucar, Luka
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorMao, Ming
dc.contributor.imecauthorPuliyalil, Harinarayanan
dc.contributor.imecauthorTeugels, Lieve
dc.contributor.imecauthorTsvetanova, Diana
dc.contributor.imecauthorNag, Manoj
dc.contributor.imecauthordel Agua Borniquel, Jose Ignacio
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorWilson, Chris
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecPuliyalil, Harinarayanan::0000-0002-9749-5307
dc.contributor.orcidimecTeugels, Lieve::0000-0002-6613-9414
dc.contributor.orcidimecTsvetanova, Diana::0000-0002-5632-5539
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage205
dc.source.endpage217
dc.source.conferencePRiME 2020: Thin Film Transistors 15 (TFT)
dc.source.conferencedate4/10/2020
dc.source.conferencelocationonline online
dc.identifier.urlhttps://iopscience.iop.org/article/10.1149/09807.0205ecst
imec.availabilityPublished - open access
imec.internalnotesECS Transactions Transactions (ECST); Vol. 98, Nr. 7


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