Show simple item record

Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

dc.contributor.authorMukherjee, Kalparupa
dc.contributor.authorBorga, Matteo
dc.contributor.authorRuzzarin, Maria
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorStoffels, Steve
dc.contributor.authorYou, Shuzhen
dc.contributor.authorGeens, Karen
dc.contributor.authorLiang, Hu
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghini, Matteo
dc.date.accessioned2021-10-29T01:08:05Z
dc.date.available2021-10-29T01:08:05Z
dc.date.issued2020
dc.identifier.issn1882-0778
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35621
dc.sourceIIOimport
dc.titleAnalysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
dc.typeJournal article
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorRuzzarin, Maria
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage24004
dc.source.journalApplied Physics Express
dc.source.issue2
dc.source.volume13
dc.identifier.urlhttps://doi.org/10.35848/1882-0786/ab6ddd
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record