Publication:

Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

Date

2020

Journal article

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Author(s)

Mukherjee, Kalparupa

;

;

Ruzzarin, Maria

;

De Santi, Carlo

;

Stoffels, Steve

;

;

;

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

;

Meneghini, Matteo

Journal

Applied Physics Express

Metrics

2007 since deposited on 2021-10-29

Acq. date: 2026-01-09