Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

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Author(s)

Mukherjee, Kalparupa

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;

Ruzzarin, Maria

;

De Santi, Carlo

;

Stoffels, Steve

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;

;

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

;

Meneghini, Matteo

Journal

Applied Physics Express

Metrics

2005 since deposited on 2021-10-29

Acq. date: 2025-10-23