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Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
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Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mukherjee, Kalparupa
;
Borga, Matteo
;
Ruzzarin, Maria
;
De Santi, Carlo
;
Stoffels, Steve
;
You, Shuzhen
;
Geens, Karen
;
Liang, Hu
;
Decoutere, Stefaan
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo
Journal
Applied Physics Express
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2007
since deposited on 2021-10-29
Acq. date: 2025-12-11
Citations
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Views
2007
since deposited on 2021-10-29
Acq. date: 2025-12-11
Citations