Publication:

Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

Date

2020
Journal article
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Author(s)

Mukherjee, Kalparupa
;
Borga, Matteo  
;
Ruzzarin, Maria  
;
De Santi, Carlo
;
Stoffels, Steve  
;
You, Shuzhen  
;
Geens, Karen  
;
Liang, Hu  
;
Decoutere, Stefaan  
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo

Journal

Applied Physics Express

Abstract

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2008 since deposited on 2021-10-29
Acq. date: 2026-03-16

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2008 since deposited on 2021-10-29
Acq. date: 2026-03-16

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