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Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy

dc.contributor.authorOp de Beeck, Jonathan
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorParedis, Kristof
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorGeiser, Brian
dc.contributor.authorBunton, Joe
dc.contributor.authorUlfig, Robert
dc.contributor.authorLarson, Dave
dc.date.accessioned2021-10-29T01:36:25Z
dc.date.available2021-10-29T01:36:25Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35677
dc.sourceIIOimport
dc.titleImproved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
dc.typeMeeting abstract
dc.contributor.imecauthorOp de Beeck, Jonathan
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecOp de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage20
dc.source.conferenceAtom Probe Tomography & Microscopy (APT&M) 2020
dc.source.conferencedate16/11/2020
dc.source.conferencelocationOxford United Kingdom
dc.identifier.urlhttps://www.atomprobe.com/-/media/ametekatomprobe/files/news-and-events/pdf/aptmprogrammedraft201109.pdf?dmc=1&la=en&revision=ab8adfd1-ecf4-4afa-b90e-80f8a254534f&hash=028E619DEA1AFCAABF7B724B28D040D6
imec.availabilityPublished - open access


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