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Measuring thermal conductivity in a microfluidic device with the transient thermal offset (TTO) method

dc.contributor.authorOudebrouckx, Gilles
dc.contributor.authorVandenryt, Thys
dc.contributor.authorBormans, Seppe
dc.contributor.authorWagner, Patrick
dc.contributor.authorThoelen, Ronald
dc.date.accessioned2021-10-29T01:42:37Z
dc.date.available2021-10-29T01:42:37Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35689
dc.sourceIIOimport
dc.titleMeasuring thermal conductivity in a microfluidic device with the transient thermal offset (TTO) method
dc.typeProceedings paper
dc.contributor.imecauthorOudebrouckx, Gilles
dc.contributor.imecauthorVandenryt, Thys
dc.contributor.imecauthorBormans, Seppe
dc.contributor.imecauthorThoelen, Ronald
dc.contributor.orcidimecThoelen, Ronald::0000-0001-6845-0866
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceIEEE Sensors 2020
dc.source.conferencedate25/10/2020
dc.source.conferencelocationRotterdam The Netherlands
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9278579
imec.availabilityPublished - open access


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