dc.contributor.author | Perra, Cristian | |
dc.contributor.author | Freitas, Pedro Garcia | |
dc.contributor.author | Seidel, Ismael | |
dc.contributor.author | Schelkens, Peter | |
dc.date.accessioned | 2021-10-29T02:06:32Z | |
dc.date.available | 2021-10-29T02:06:32Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35732 | |
dc.source | IIOimport | |
dc.title | An overview of the emerging JPEG Pleno standard, conformance testing and reference software | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Schelkens, Peter | |
dc.contributor.orcidimec | Schelkens, Peter::0000-0003-0908-1655 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113530Y | |
dc.source.conference | Optics, Photonics and Digital Technologies for Imaging Applications VI | |
dc.source.conferencedate | 29/03/2020 | |
dc.source.conferencelocation | Strasbourg France | |
dc.identifier.url | https://doi.org/10.1117/12.2555841 | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 11353 | |