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dc.contributor.authorPerra, Cristian
dc.contributor.authorFreitas, Pedro Garcia
dc.contributor.authorSeidel, Ismael
dc.contributor.authorSchelkens, Peter
dc.date.accessioned2021-10-29T02:06:32Z
dc.date.available2021-10-29T02:06:32Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35732
dc.sourceIIOimport
dc.titleAn overview of the emerging JPEG Pleno standard, conformance testing and reference software
dc.typeProceedings paper
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.source.peerreviewyes
dc.source.beginpage113530Y
dc.source.conferenceOptics, Photonics and Digital Technologies for Imaging Applications VI
dc.source.conferencedate29/03/2020
dc.source.conferencelocationStrasbourg France
dc.identifier.urlhttps://doi.org/10.1117/12.2555841
imec.availabilityPublished - imec
imec.internalnotesProceedings of SPIE; Vol. 11353


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